@misc{indiciae7d19fdb2a24e,
  title = {E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods},
  author = {Eshan Singh and Clark Barrett and Subhasish Mitra},
  year = {2017},
  url = {https://arxiv.org/abs/1707.07671},
  note = {Source identifier: 1707.07671}
}