TY  - RPRT
TI  - E-QED: Electrical Bug Localization During Post-Silicon Validation Enabled by Quick Error Detection and Formal Methods
AU  - Eshan Singh
AU  - Clark Barrett
AU  - Subhasish Mitra
PY  - 2017
UR  - https://arxiv.org/abs/1707.07671
ID  - 1707.07671
ER  -