TY  - RPRT
TI  - Enhanced optical Kerr effect method for a detailed characterization of the third order nonlinearity of 2D materials applied to graphene
AU  - Evdokia Dremetsika
AU  - Pascal Kockaert
PY  - 2017
DO  - 10.1103/physrevb.96.235422
UR  - https://arxiv.org/abs/1707.09507
ID  - 1707.09507
ER  -