@misc{indiciae9d09408bdf14,
  title = {Transient Nature of Negative Capacitance in Ferroelectric Field-Effect Transistors},
  author = {Kwok Ng and Steven J. Hillenius and Alexei Gruverman},
  year = {2017},
  doi = {10.1016/j.ssc.2017.07.020},
  url = {https://arxiv.org/abs/1708.01382},
  note = {Source identifier: 1708.01382}
}