TY  - RPRT
TI  - Transient Nature of Negative Capacitance in Ferroelectric Field-Effect Transistors
AU  - Kwok Ng
AU  - Steven J. Hillenius
AU  - Alexei Gruverman
PY  - 2017
DO  - 10.1016/j.ssc.2017.07.020
UR  - https://arxiv.org/abs/1708.01382
ID  - 1708.01382
ER  -