TY  - RPRT
TI  - An Early In-Situ Stress Signature of the AlN-Si Pre-growth Interface for Successful Integration of Nitrides with (111) Si
AU  - Hareesh Chandrasekar
AU  - Nagaboopathy Mohan
AU  - Abheek Bardhan
AU  - KN Bhat
AU  - Navakanta Bhat
AU  - N Ravishankar
AU  - Srinivasan Raghavan
PY  - 2017
DO  - 10.1063/1.4831968
UR  - https://arxiv.org/abs/1708.03809
ID  - 1708.03809
ER  -