TY  - RPRT
TI  - Dielectric Engineering of HfO2 Gate Stacks Towards Normally-ON and Normally-OFF GaN HEMTs on Silicon
AU  - Hareesh Chandrasekar
AU  - Sandeep Kumar
AU  - K. L. Ganapathi
AU  - Shreesha Prabhu
AU  - Surani Bin Dolmanan
AU  - Sudhiranjan Tripathy
AU  - Srinivasan Raghavan
AU  - K. N. Bhat
AU  - Sangeneni Mohan
AU  - R. Muralidharan
AU  - Navakanta Bhat
AU  - Digbijoy N. Nath
PY  - 2017
UR  - https://arxiv.org/abs/1708.03811
ID  - 1708.03811
ER  -