TY  - RPRT
TI  - A New Method for Characterizing Bulk and Surface Conductivities of Three-Dimensional Topological Insulators: Inverted Resistance Measurements
AU  - Y. S. Eo
AU  - K. Sun
AU  - Ç. Kurdak
AU  - D. -J. Kim
AU  - Z. Fisk
PY  - 2017
DO  - 10.1103/physrevapplied.9.044006
UR  - https://arxiv.org/abs/1708.05762
ID  - 1708.05762
ER  -