TY  - RPRT
TI  - A statistical analysis of two-dimensional patterns and its application to astrometry
AU  - Petr Zavada
AU  - Karel Píška
PY  - 2018
DO  - 10.1051/0004-6361/201732170
UR  - https://arxiv.org/abs/1708.06560
ID  - 1708.06560
ER  -