TY  - RPRT
TI  - Characterization of the sub-micrometer hierarchy levels in the twist-bend nematic phase with nanometric helices via photopolymerization. Explanation for the sign reversal in the polar response
AU  - Vitaly P. Panov
AU  - Sithara P. Sreenilayam
AU  - Yuri P. Panarin
AU  - Jagdish K. Vij
AU  - Chris J. Welch
AU  - Georg H. Mehl
PY  - 2017
DO  - 10.1021/acs.nanolett.7b03441
UR  - https://arxiv.org/abs/1708.07013
ID  - 1708.07013
ER  -