TY  - RPRT
TI  - Scaling behaviour of thin films on chemically heterogenous walls
AU  - Alexandr Malijevský
AU  - Andrew O. Parry
AU  - Martin Pospíšil
PY  - 2017
UR  - https://arxiv.org/abs/1708.08658
ID  - 1708.08658
ER  -