TY  - RPRT
TI  - Quantifying the intrinsic surface charge density and charge-transfer resistance of the graphene-solution interface through bias-free low-level charge measurement
AU  - Jinglei Ping
AU  - A. T. Charlie Johnson
PY  - 2017
DO  - 10.1063/1.4955404
UR  - https://arxiv.org/abs/1708.08962
ID  - 1708.08962
ER  -