TY  - RPRT
TI  - Temperature dependence of universal conductance fluctuation due to development of weak localization in graphene
AU  - D. Terasawa
AU  - A. Fukuda
AU  - A. Fujimoto
AU  - Y. Ohno
AU  - K. Matsumoto
PY  - 2017
DO  - 10.1016/j.ssc.2017.09.002
UR  - https://arxiv.org/abs/1709.00212
ID  - 1709.00212
ER  -