TY  - RPRT
TI  - Effects of hole self-trapping by polarons on transport and negative bias illumination stress in amorphous-IGZO
AU  - Albert de Jamblinne de Meux
AU  - Geoffrey Pourtois
AU  - Jan Genoe
AU  - Paul Heremans
PY  - 2017
DO  - 10.1063/1.4986180
UR  - https://arxiv.org/abs/1709.03728
ID  - 1709.03728
ER  -