TY  - RPRT
TI  - Learning from a lot: Empirical Bayes in high-dimensional prediction settings
AU  - Mark A. van de Wiel
AU  - Dennis E. te Beest
AU  - Magnus Münch
PY  - 2018
UR  - https://arxiv.org/abs/1709.04192
ID  - 1709.04192
ER  -