TY  - RPRT
TI  - Influence of the effective layer thickness on the groundstate and excitonic properties of transition-metal dichalcogenide systems
AU  - Lars Meckbach
AU  - Tineke Stroucken
AU  - Stephan W. Koch
PY  - 2017
DO  - 10.1103/physrevb.97.035425
UR  - https://arxiv.org/abs/1709.09056
ID  - 1709.09056
ER  -