@misc{indiciae557d32120abb,
  title = {On-the-fly Data Assessment for High Throughput X-ray Diffraction Measurement},
  author = {Fang Ren and Ronald Pandolfi and Douglas Van Campen and Alexander Hexemer and Apurva Mehta},
  year = {2017},
  doi = {10.1021/acscombsci.7b00015},
  url = {https://arxiv.org/abs/1709.09261},
  note = {Source identifier: 1709.09261}
}