TY  - RPRT
TI  - Measurement of the surface susceptibility and the surface conductivity of atomically thin $\rm MoS_2$ by spectroscopic ellipsometry
AU  - Gaurav Jayaswal
AU  - Zhenyu Dai
AU  - Xixiang Zhang
AU  - Mirko Bagnarol
AU  - Alessandro Martucci
AU  - Michele Merano
PY  - 2017
DO  - 10.1364/ol.43.000703
UR  - https://arxiv.org/abs/1710.00340
ID  - 1710.00340
ER  -