TY  - RPRT
TI  - Optical constants of DC sputtering derived ITO, TiO2 and TiO2:Nb thin films characterized by spectrophotometry and spectroscopic ellipsometry for optoelectronic devices
AU  - Mohammed Rasheed
AU  - Regis Barille
PY  - 2017
DO  - 10.1016/j.jnoncrysol.2017.04.027
UR  - https://arxiv.org/abs/1710.04814
ID  - 1710.04814
ER  -