TY  - RPRT
TI  - Vacancy defect in bulk and at (10$\overline{1}$0) surface of GaN: A combined first-principles theoretical and experimental analysis
AU  - Sanjay Nayak
AU  - Mit H. Naik
AU  - Manish Jain
AU  - U. V. Waghmare
AU  - S. M. Shivaprasad
PY  - 2017
UR  - https://arxiv.org/abs/1710.05670
ID  - 1710.05670
ER  -