TY  - RPRT
TI  - IP determination and 1+1 REMPI spectrum of SiO at 210-220 nm with implications for SiO$^{+}$ ion trap loading
AU  - Patrick R. Stollenwerk
AU  - Ivan O. Antonov
AU  - Brian C. Odom
PY  - 2017
DO  - 10.1016/j.jms.2018.11.008
UR  - https://arxiv.org/abs/1710.08905
ID  - 1710.08905
ER  -