@misc{indiciae67f7d30ac8a7,
  title = {Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa\$\_2\$Cu\$\_3\$O\$\_\{7-δ\}\$ thin films},
  author = {Nicolas Gauquelin and Hao Zhang and Guozhen Zhu and John Y. T. Wei and Gianluigi A. Botton},
  year = {2017},
  url = {https://arxiv.org/abs/1710.10667},
  note = {Source identifier: 1710.10667}
}