TY  - RPRT
TI  - Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa$_2$Cu$_3$O$_{7-δ}$ thin films
AU  - Nicolas Gauquelin
AU  - Hao Zhang
AU  - Guozhen Zhu
AU  - John Y. T. Wei
AU  - Gianluigi A. Botton
PY  - 2017
UR  - https://arxiv.org/abs/1710.10667
ID  - 1710.10667
ER  -