TY  - RPRT
TI  - A study of variability induced by events dependency in microelectronic production
AU  - Kean Dequeant
AU  - Pierre Lemaire
AU  - Marie-Laure Espinouse
AU  - Philippe Vialletelle
PY  - 2017
UR  - https://arxiv.org/abs/1711.06261
ID  - 1711.06261
ER  -