TY  - RPRT
TI  - Critical behavior of a stochastic anisotropic Bak-Sneppen model
AU  - Jihui Han
AU  - Wei Li
AU  - Zhu Su
AU  - Weibing Deng
PY  - 2017
DO  - 10.1140/epjb/e2017-80022-y
UR  - https://arxiv.org/abs/1711.07367
ID  - 1711.07367
ER  -