@misc{indiciae99d579020092,
  title = {Glancing-Incidence Focussed Ion Beam Milling: A Coherent X-ray Diffraction Study of 3D Nano-scale Lattice Strains and Crystal Defects},
  author = {Felix Hofmann and Ross J. Harder and Wenjun Liu and Yuzi Liu and Ian K Robinson and Yevhen Zayachuk},
  year = {2017},
  url = {https://arxiv.org/abs/1711.10291},
  note = {Source identifier: 1711.10291}
}