TY  - RPRT
TI  - Glancing-Incidence Focussed Ion Beam Milling: A Coherent X-ray Diffraction Study of 3D Nano-scale Lattice Strains and Crystal Defects
AU  - Felix Hofmann
AU  - Ross J. Harder
AU  - Wenjun Liu
AU  - Yuzi Liu
AU  - Ian K Robinson
AU  - Yevhen Zayachuk
PY  - 2017
UR  - https://arxiv.org/abs/1711.10291
ID  - 1711.10291
ER  -