TY  - RPRT
TI  - Native point defects of semiconducting layered Bi2O2Se
AU  - Huanglong Li
AU  - Xintong Xu
AU  - Yi Zhang
AU  - Roland Gillen
AU  - Luping Shi
AU  - John Robertson
PY  - 2021
DO  - 10.1038/s41598-018-29385-8
UR  - https://arxiv.org/abs/1712.00532
ID  - 1712.00532
ER  -