@misc{indiciae472b5bbf054b,
  title = {Chip-Level Electromigration Reliability Evaluation with Multiple On-Die Variation Effects},
  author = {Karthik Airani and Rohit Guttal},
  year = {2017},
  url = {https://arxiv.org/abs/1712.05562},
  note = {Source identifier: 1712.05562}
}