@misc{indiciae6b3976ed362f,
  title = {Effect of NBTI/PBTI Aging and Process Variations on Write Failures in MOSFET and FinFET Flip-Flops},
  author = {Usman Khalid and Antonio Mastrandrea and Mauro Olivieri},
  year = {2017},
  doi = {10.1016/j.microrel.2015.07.050},
  url = {https://arxiv.org/abs/1712.06934},
  note = {Source identifier: 1712.06934}
}