TY  - RPRT
TI  - Effect of NBTI/PBTI Aging and Process Variations on Write Failures in MOSFET and FinFET Flip-Flops
AU  - Usman Khalid
AU  - Antonio Mastrandrea
AU  - Mauro Olivieri
PY  - 2017
DO  - 10.1016/j.microrel.2015.07.050
UR  - https://arxiv.org/abs/1712.06934
ID  - 1712.06934
ER  -