TY  - RPRT
TI  - Analytical Modeling of Metal Gate Granularity based Threshold Voltage Variability in NWFET
AU  - P Harsha Vardhan
AU  - Sushant Mittal
AU  - Swaroop Ganguly
AU  - Udayan Ganguly
PY  - 2018
DO  - 10.1016/j.sse.2018.05.007
UR  - https://arxiv.org/abs/1801.00935
ID  - 1801.00935
ER  -