@misc{indiciaeb0e9022f7f20,
  title = {Charge collection properties of irradiated depleted CMOS pixel test structures},
  author = {I. Mandić and V. Cindro and A. Gorišek and B. Hiti and G. Kramberger and M. Zavrtanik and M. Mikuž and T. Hemperek},
  year = {2018},
  doi = {10.1016/j.nima.2018.06.062},
  url = {https://arxiv.org/abs/1801.03671},
  note = {Source identifier: 1801.03671}
}