TY  - RPRT
TI  - Contactless method to measure 2DEG charge density and band structure in high electron mobility transistor structures
AU  - Yury Turkulets
AU  - Ilan Shalish
PY  - 2018
DO  - 10.1109/jeds.2018.2841374
UR  - https://arxiv.org/abs/1801.04974
ID  - 1801.04974
ER  -