TY  - RPRT
TI  - Measurement of low-energy background events due to $^{222}$Rn contamination on the surface of a NaI(Tl) crystal
AU  - K. W. Kim
AU  - C. Ha
AU  - N. Y. Kim
AU  - Y. D. Kim
AU  - H. S. Lee
AU  - B. J. Park
AU  - H. K. Park
PY  - 2018
DO  - 10.1016/j.astropartphys.2018.05.004
UR  - https://arxiv.org/abs/1801.06948
ID  - 1801.06948
ER  -