TY  - RPRT
TI  - Quardratic Electromechanical Strain in Silicon Investigated by Scanning Probe Microscopy
AU  - Junxi Yu
AU  - Ehsan Nasr Esfahani
AU  - Qingfeng Zhu
AU  - Dongliang Shan
AU  - Tingting Jia
AU  - Shuhong Xie
AU  - Jiangyu Li
PY  - 2018
DO  - 10.1063/1.5023407
UR  - https://arxiv.org/abs/1801.10238
ID  - 1801.10238
ER  -