TY  - RPRT
TI  - The Impact of Correlated Metrics on Defect Models
AU  - Jirayus Jiarpakdee
AU  - Chakkrit Tantithamthavorn
AU  - Ahmed E. Hassan
PY  - 2018
UR  - https://arxiv.org/abs/1801.10271
ID  - 1801.10271
ER  -