@misc{indiciae21df022a0198,
  title = {Root Cause Analysis and Correction of Single Metal Contact Open-Induced Scan Chain Failure in 90nm node VLSI},
  author = {Chao-Cheng Ting and Ya-Chi Liu and Hsuan-Hsien Chen and Chung-Ching Tsai and Liwen Shih},
  year = {2018},
  url = {https://arxiv.org/abs/1801.10333},
  note = {Source identifier: 1801.10333}
}