TY  - RPRT
TI  - Root Cause Analysis and Correction of Single Metal Contact Open-Induced Scan Chain Failure in 90nm node VLSI
AU  - Chao-Cheng Ting
AU  - Ya-Chi Liu
AU  - Hsuan-Hsien Chen
AU  - Chung-Ching Tsai
AU  - Liwen Shih
PY  - 2018
UR  - https://arxiv.org/abs/1801.10333
ID  - 1801.10333
ER  -