TY  - RPRT
TI  - Measurement of optical constants of TiN and TiN/Ti/TiN multilayer films for microwave kinetic inductance photon-number-resolving detectors
AU  - M. Dai
AU  - W. Guo
AU  - X. Liu
AU  - M. Zhang
AU  - Y. Wang
AU  - L. F. Wei
AU  - G. C. Hilton
AU  - J. Hubmayr
AU  - J. Ullom
AU  - J. Gao
AU  - M. R. Vissers
PY  - 2018
DO  - 10.1007/s10909-018-2095-9
UR  - https://arxiv.org/abs/1802.06737
ID  - 1802.06737
ER  -