TY  - RPRT
TI  - Measurement of optical to electrical and electrical to optical delays with ps-level uncertainty
AU  - H. Z. Peek
AU  - T. J. Pinkert
AU  - P. P. M. Jansweijer
AU  - J. C. J. Koelemeij
PY  - 2018
DO  - 10.1364/oe.26.014650
UR  - https://arxiv.org/abs/1802.07567
ID  - 1802.07567
ER  -