TY  - RPRT
TI  - Simulation of Thin-TFETs Using Transition Metal Dichalcogenides: Effect of Material Parameters, Gate Dielectric on Electrostatic Device Performance
AU  - Kanak Datta
AU  - Quazi D. M. Khosru
PY  - 2018
DO  - 10.1007/s10825-017-0978-7
UR  - https://arxiv.org/abs/1802.09140
ID  - 1802.09140
ER  -