@misc{indiciaee4f5ebc71d3c,
  title = {On the Interfacial Phase Growth and Vacancy Evolution during Accelerated Electromigration in Cu/Sn/Cu Microjoints},
  author = {Vahid Attari and Supriyo Ghosh and Thien Duong and Raymundo Arroyave},
  year = {2018},
  doi = {10.1016/j.actamat.2018.08.049},
  url = {https://arxiv.org/abs/1803.07227},
  note = {Source identifier: 1803.07227}
}