TY  - RPRT
TI  - On the Interfacial Phase Growth and Vacancy Evolution during Accelerated Electromigration in Cu/Sn/Cu Microjoints
AU  - Vahid Attari
AU  - Supriyo Ghosh
AU  - Thien Duong
AU  - Raymundo Arroyave
PY  - 2018
DO  - 10.1016/j.actamat.2018.08.049
UR  - https://arxiv.org/abs/1803.07227
ID  - 1803.07227
ER  -