@misc{indiciae609754a2c86c,
  title = {Connecting Complex Electronic Pattern Formation to Critical Exponents},
  author = {Shuo Liu and E. W. Carlson and K. A. Dahmen},
  year = {2018},
  doi = {10.3390/condmat6040039},
  url = {https://arxiv.org/abs/1803.08485},
  note = {Source identifier: 1803.08485}
}