TY  - RPRT
TI  - Connecting Complex Electronic Pattern Formation to Critical Exponents
AU  - Shuo Liu
AU  - E. W. Carlson
AU  - K. A. Dahmen
PY  - 2018
DO  - 10.3390/condmat6040039
UR  - https://arxiv.org/abs/1803.08485
ID  - 1803.08485
ER  -