TY  - RPRT
TI  - Quantitative Measurements of Nanoscale Permittivity and Conductivity Using Tuning-fork-based Microwave Impedance Microscopy
AU  - Xiaoyu Wu
AU  - Zhenqi Hao
AU  - Di Wu
AU  - Lu Zheng
AU  - Zhanzhi Jiang
AU  - Vishal Ganesan
AU  - Yayu Wang
AU  - Keji Lai
PY  - 2018
DO  - 10.1063/1.5022997
UR  - https://arxiv.org/abs/1803.10821
ID  - 1803.10821
ER  -