@misc{indiciaec3430f4283a7,
  title = {High-resolution resonant inelastic soft X-ray scattering as a probe of the crystal electrical field in lanthanides demonstrated for the case of CeRh2Si2},
  author = {A. Amorese and N. Caroca-Canales and S. Seiro and C. Krellner and G. Ghiringhelli and N. B. Brookes and D. V. Vyalikh and C. Geibel and K. Kummer},
  year = {2018},
  doi = {10.1103/physrevb.97.245130},
  url = {https://arxiv.org/abs/1803.11068},
  note = {Source identifier: 1803.11068}
}