TY  - RPRT
TI  - High-resolution resonant inelastic soft X-ray scattering as a probe of the crystal electrical field in lanthanides demonstrated for the case of CeRh2Si2
AU  - A. Amorese
AU  - N. Caroca-Canales
AU  - S. Seiro
AU  - C. Krellner
AU  - G. Ghiringhelli
AU  - N. B. Brookes
AU  - D. V. Vyalikh
AU  - C. Geibel
AU  - K. Kummer
PY  - 2018
DO  - 10.1103/physrevb.97.245130
UR  - https://arxiv.org/abs/1803.11068
ID  - 1803.11068
ER  -