@misc{indiciaeb2e5050313db,
  title = {From randomized benchmarking experiments to gateset circuit fidelity: how to interpret randomized benchmarking decay parameters},
  author = {Arnaud Carignan-Dugas and Kristine Boone and Joel J. Wallman and Joseph Emerson},
  year = {2018},
  doi = {10.1088/1367-2630/aadcc7},
  url = {https://arxiv.org/abs/1804.01122},
  note = {Source identifier: 1804.01122}
}